Software analyzes surface profile data

OmniSurf 5.0 from Digital Metrology Solutions is software for analyzing surface profile data. Featuring a new interface and dozens of new features, the company says it is a complete toolbox for analyzing data from roughness measurement instruments.

Released in October 2026, this version serves as a visual, instrument-independent toolkit designed to bring advanced surface texture and roughness analysis out of the traditional quality lab and directly into the hands of engineers and designers. It enables users to interactively explore raw profile data to configure manufacturing specifications, fine-tune production processes, and troubleshoot surface component failures.

Kew features

• Revamped User Interface: Integrates all pre-processing, filtering, and parameter configurations into a single, cohesive analysis workflow area.
• Universal Format Support: Processes surface data across multiple instrument brands and supply chains, supporting native file extensions like .sig, .sdf, .x3p, .txt, and proprietary manufacturer formats from Taylor Hobson, Mahr, Mitutoyo, and Zeiss.
• Interactive Filtering: Features ten ISO 16610/16620 filtering options along with a live Wavelength Content graph, allowing users to visually adjust filter cutoffs to seamlessly separate roughness from waviness based on actual measurement data.
• Advanced Wear Analysis: Introduces a “Macro Wear” tool to rapidly compute the depths and volumes of physical wear scars, alongside a “Micro Wear” function that quantifies microscopic degradation without requiring accelerated stress testing.
• Morphological & Stylus Filters: Implements morphological closing/opening filters to identify underlying material voids (leaks) or sharp features that might penetrate oil films, as well as unique stylus flanking indicators to highlight measurement errors.