LineScan Laser Line Sensors

July 01, 2014

ZEISS Industrial Metrology announced the new family of LineScan laser line sensors that improve inspection productivity and enable reverse engineering of complex products on popular CONTURA, ACCURA II and PRISMO CMMs. The new LineScan sensors easily extend the functionality of ZEISS CMM and are available with stripe widths of 25mm, 50mm and 100mm.

Inspection productivity is improved by scanning workpieces at rates of up 700,000 points/second, with a measurement precision figure of merit (MPE(PF) as defined by ISO-10360-2) as low as 12 um, and storing point cloud information in the CMM host computer. With resolution of 1280 points/line and no need for an extra controller, the new LineScan sensors utilize a 658 nm wavelength visible red light source. Each unit is IP54 certified to protect from dust and water.

The new LineScan sensors are immediately available with the new ZEISS CONTURA, ACCURA II and PRISMO CMMs using the ZEISS RDS probe system and CALYPSO 2014 software. These sensors can also be retrofit to select ZEISS CMMs in the field.

Applications include inspection of car bodies, tools for molds, construction and design tools, as well as reverse engineering of contact-sensitive or finely structured surfaces. Reverse engineering is the process for creating a 3D computer model from a solid object so that additional prototypes can then be made from the model.

The new LineScan sensors further expand the industry-leading selection of active scanning, passive scanning, camera, line scan and optical triangulation sensors available on ZEISS CMM systems.

Related Glossary Terms

  • metrology

    metrology

    Science of measurement; the principles on which precision machining, quality control and inspection are based. See precision machining, measurement.

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