Mahr Federal has introduced a new video measuring microscope with image processing capability. Designed for the measurement and/or dimensioning of geometric elements, the MarVision QM 300 incorporates an integrated CCD color camera with a 23" touchscreen PC with keyboard and mouse, and Windows 8 based M3 software. Automatic edge detection allows even low contrast features to be measured, and a multi-touch function provides quick and continuous measurements using either touchscreen or the mouse. The QM 300 is a full-featured measuring station designed for fast, close to the grinding machine evaluation of cutting inserts or flat components such as punch and stamped parts.

"MarVision optical measuring instruments offer a quick and reliable solution to many different 2D measurement and inspection tasks," said Rory Neill, Mahr Federal Product Manager for Precision Gages. "Applications range from cutting tools and precision products for manufacturing, plastics, and medical technology, to miniaturized electronic components. These extremely precise measuring instruments are designed to meet the highest quality and production requirements."

The MarVision QM 300 has a 40mm (1.57") adjustable measuring table with a depth of focus of 10mm (0.4"). The 5 Megapixel camera system provides for sharper imaging. Illumination is provided by a quadrant LED ring top light with four individually controlled segments, and table mounted Telecentric LED transmitted light for more focused measurement of rotationally symmetric parts.

The automated video edge detection and multi-touch functions make the MarVision QM 300 especially suitable for a wide range of punched and flexible parts, plastic components, and electronic circuit boards. Measurement and evaluation functions include: Point, such as the intersection of straight lines; Line, including line of best fit and/or centerline; automatic calculation of a Circle, including index and pitch circles; Distance between points or point and line; Angle taken from two lines; and Alignment of axis of the coordinate system on the test piece.