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The extended version of PiWeb sbs quality data management software, tailored for small and medium-sized businesses, is being introduced today by ZEISS Industrial Metrology. ZEISS PiWeb sbs makes it possible to connect all gaging and inspection devices into one common reporting system, allowing customers to standardize reporting requirements across a wide range of metrology inspection devices and personalize reports. Enhanced graphical representation of measured parts makes it easier and faster to communicate part quality. ZEISS PiWeb sbs reduces administrative labor costs by automating and simplifying the creation of many time-consuming quality documents and inspection process control forms.
ZEISS PiWeb sbs combines and reports inspection data from one or multiple measuring devices into graphical part stories, SPC charts and quality documents. Users can also create graphical interfaces to assist inspectors in collecting data from manual gages or visual inspection parameters.
Engineering, production and quality managers have remote and independent access to view reports. Statistical functions inherited by ZEISS PiWeb sbs may be added to reports to enhance part stories, create SPC tables or used for live monitoring and process control.
ZEISS PiWeb sbs enhanced reporting capability is fulfilling our customer requests and the industries' trends for clearer, more accessible and personalized reports.
Related Glossary Terms
- metrology
metrology
Science of measurement; the principles on which precision machining, quality control and inspection are based. See precision machining, measurement.
- process control
process control
Method of monitoring a process. Relates to electronic hardware and instrumentation used in automated process control. See in-process gaging, inspection; SPC, statistical process control.
- statistical process control ( SPC)
statistical process control ( SPC)
Statistical techniques to measure and analyze the extent to which a process deviates from a set standard.
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