Eric Felkel

Of unique importance today is the role of post-process metrology to validate the integrity of AM builds. One specific reason for this importance is that many parts produced by AM end up in safety critical applications where end-use functionality is of vital importance. The nature and relative roughness of AM surfaces, whether analyzing individual layers within a build, or the surface of a finished part render conventional metrology solutions somewhat impotent. In this article, I review developments from Zygo including work alongside Richard Leach that allow for hitherto unattainable metrology results, which are being used to enhance the use of AM as a production technology by making validation protocols more efficient.