Surface Analyzing Equipment

Zygo Corp. announced the Nexview profiler, its next-generation 3D imaging and measurement system for rapid, precise, quantitative and interactive surface metrology.

The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors.

SICK announced the launch of the Profiler 2 short range distance sensor for measuring profiles and surfaces of complex objects with one laser line.

The L.S. Starrett Co. announced its portable SR100 Surface Roughness Tester.

The new SR200 Surface Roughness Tester from The L.S. Starrett Co. is a powerful, full featured instrument that can be used either freestanding (on horizontal, vertical or even inverted surfaces) or bench-mounted with fixturing for batch measurement and laboratory applications.

Mitutoyo has introduced the new SURFTEST PROBE and SURFPAK-SP software, allowing surface roughness analysis on a Mitutoyo CNC CMM and eliminating the need for workpiece changeover to a second measurement device.

The MarSurf UD 120 from Mahr Federal Inc. can generate both surface and contour measurements in a single pass.

Mahr Federal Inc. has introduced a new option package for their MarForm mmQ 200 Formtester which provides the measurement of surface finish parameters according to accepted ISO, ASME and JIS standards.

Mahr Federal has introduced an economical and powerful skidless surface evaluation system to its MarSurf line of mobile surface metrology systems.

With the introduction of the MarSurf XR 1 surface measuring system, Mahr has bridged the gap between portable surface measuring devices and larger, full-featured, PC-based surface measurement and evaluation systems.