750 kV X-ray Source
Nikon Metrology announces a unique 750 kV X-ray source withµm level spot size.
Operation / Process
Inspection & Quality
When to adopt a new technology
Determining the appropriate time to implement new technology.
Steady aim
Despite setbacks, a South Carolina shop thrives, develops winning production strategy.
R&R time
Gage repeatability and reproducibility studies improve measurement systems.
Leica T-Scan 5 Laser Trackers
Hexagon Metrology announced the launch of the latest generation of the Leica T-Scan.
Spring Profile Measurement System
LaserLinc has introduced a new system for measuring the diameter and pitch of springs, coiled tubing, and other corrugated or convoluted products.
IP65 Coolant Proof and MDC-Lite Micrometer
Mitutoyo America Corp. is now offering enhanced versions of its popular Mitutoyo IP65 Coolant Proof and MDC-Lite Micrometer line with ABSOLUTE sensor technology.
Surface Finish Gage
From Jenoptik Industrial Metrology comes a crankshaft journal surface finish gage that greatly reduces the time required to collect and assess measurement data of virtually any crankshaft, any of its journals.
BES R04 Block Sensor
Balluff expands its inductive sensor miniature line with the addition of the BES R04 block sensor.
CONTURA Coordinate Measuring Machine
The latest generation of the successful ZEISS CONTURA coordinate measuring machine is entering the market.
F-senso Spindle Pull-in Force Measuring Device
A new version of the F-senso spindle pull-in force measuring device from Röhm Products of America is engineered for use with clamping systems for smaller tool shanks including HSK A 25, A 32 and A 40 and steep taper SK [CAT/BT] 30.
SMZ1270/SMZ1270i and SMZ800N Stereo Microscopes
Nikon Metrology announces the release of SMZ1270, a stereo microscope with the largest zoom ratio in its class, SMZ1270i, a version of SMZ1270 with intelligent features, and SMZ800N with enhanced optics and operability.